二碲化鈮晶體 NbTe2（Niobium Selenide） 晶體尺寸：~8毫米電學性能：金屬，半導體（TC ~ 0.7k）晶體結(jié)構(gòu)：單斜晶系，C晶胞參數(shù)：a＝1.470 nm，b＝0.364，c＝0.935 nm，α＝γ＝90#176;，β＝108#176;晶體類型：合成晶體純度：＞99.995%

二碲化鈮晶體 NbTe2(Niobium Selenide) 
晶體尺寸：~8毫米
電學性能：金屬，半導體（TC ~ 0.7k）
晶體結(jié)構(gòu)：單斜晶系，C
晶胞參數(shù)：a＝1.470 nm，b＝0.364，c＝0.935 nm，α＝γ＝90°，β＝108°
晶體類型：合成
晶體純度：＞99.995%

X-ray diffraction on a NbTe2 single crystal aligned along the (101) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (h 0 l), with h = l = 1, 2, 3, 4

Powder X-ray diffraction (XRD) of a single crystal NbTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal NbTe2 by Energy-dispersive X-ray spectroscopy (EDX).

Raman spectrum of a single crystal NbTe2. Measurement was performed with a 785 nm Raman system at room temperature.