Corrected Deep Ultraviolet Spectrophotometer
Computer Optimized Design
Corrected Signal for Better and Faster Results
Vacuum or Purged Operation Available
115 to 350nm overall
Adjustable sample and detector angles
Deep and vacuum ultraviolet measurements have never been better, or easier. Development and manufacture of ultraviolet lasers, optics, crystalline materials, and resonance Raman instruments, as well as basic research, require a broadly useful instrument for analysis, characterization, and test. Enter McPherson’s Vacuum Ultraviolet Analytical Spectrophotometer (VUVAS 2000.) From clean, particulate free and tight, purge or vacuum housing, to UV enhanced optics, sources, detectors, and computer optimized optical system. All VUVAS 2000 elements improve analytical results and simplify measurement tasks for the user.
The VUVAS 2000 works with gas or liquid sample cells. Most users employ optic-like substrates for transmission measurements. A three-position sample holder is standard. Cryogenic single-sample mounts, and raster-mapping attachments for large samples, are available as specials. The VUVAS also allows users to measure reflectance and easily alter angle of incidence to the sample surface. The detector is also adjustable. It can maintain theta/2-theta geometry for specular reflectance measurements, or deviate from this, to measure scatter or dispersive samples. The VUVAS design delivers absolute measurements. A single detector collects reference data as well as the final transmission or reflectance measurement. This approach enables users to qualify instrument performance, anytime and without extra accessories.
The VUVAS 2000 is a total solution. The one-touch vacuum (purge) controls and software allow users to perform high quality deep and vacuum ultraviolet measurements more easily and with higher confidence. It complements high performance UV/Vis instruments found in many laboratories and provides solid performance for the deep and vacuum ultraviolet region.
VUVAS 2000 PDF Data Sheet
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TREX UV-VIS laboratory measurements of minerals and mineral-ice mixtures
Abstract: Introduction: The Toolbox for Research and Ex-ploration (TREX) is a NASA SSERVI (Solar System Exploration Research Virtual Institute) node. TREX (trex.psi.edu) aims to decrease risk to future missions, specifically to the Moon, the Martian moons, and near- Earth asteroids, by improving mission success and assuring the safety of astronauts, their instru-ments, and spacecraft. TREX studies will focus on characteristics of the fine grains that cover the surfac-es of these target bodies – their spectral characteristics and the potential resources (such as H2O) they may harbor. TREX studies are organized into four Themes: lab studies [1], Moon studies [2], small-bodies studies [3], and field work [4]). Here we describe one of several laboratory facilities to measure the spectral reflec-tance of fine-grained geologic materials. Background: Some of the only existing far UV (FUV, ~120-200 nm) measurements of the spectral reflectance of geologic materials were made decades ago [5, 6], indicating features of potential value in di-agnostic studies of composition. An expanding set of ultraviolet spectral reflectance measurements of solar system objects from the Hubble Space Telescope, Lu-nar Reconnaissance Orbiter, Cassini, Rosetta, and oth-ers has motivated a renewed interest.. For example, FUV spectra of Ceres obtained by HST suggest the presence of graphitized carbon [7], but few compara-tive datasets exist.
G. M. Holsclaw, M. M. Osterloo, T. Munsat, and A. R. Hendrix
The second order diffraction efficiency measurements in the vacuum ultraviolet
Abstract: A simple method for measuring the second order diffraction efficiency in the vacuum ultraviolet (VUV) is described. Spectral reflectance of a mirror will be influenced by the second diffraction order, measured in a spectrophotometer system without filters. The second order diffraction efficiency can be calculated from the different spectral reflectance values. A deuterium lamp and a scintillated photomultiplier are used in the measurement system. The second order diffraction efficiency can be determined from 120nm to 165nm. The result of 0.00579±11.9% is obtained at 161nm.
Yi Qu, Shurong Wang, Zhenduo Zhang and Futian Li
Comparison between large area photo-multiplier tubes at cryogenic temperature for neutrino and rare event physics experiments
Abstract: An evaluation of the behavior of three large cathode area photo-multiplier tubes, Hamamatsu R5912 Mod and R5912-02 Mod, and ETL9357 KFLB, was carried out both at room and cryogenic temperature, using a 405nm light source. The main electrical and optical features of the devices were studied; the obtained results were compared with the characteristics of the ETL9357 FLA tubes, used in the ICARUS experiment. Tubes were also studied as a function of the Earth's magnetic field and an evaluation of the quantum efficiency was made in the vacuum ultraviolet light region.
A. Falcone, R. Bertoni, F. Boffelli, M. Bonesini, T. Cervi, A. Menegolli, C. Montanari, M.C. Prata, A. Rappoldi, G.L. Raselli, M. Rossella, M. Spanu, M. Torti, A. Zani
Optical properties of the vacuum-ultraviolet nonlinear optical crystal— BPO4
Abstract: Studies on the linear and nonlinear optical properties of the BPO4 crystal have been carried out experimentally. The transmittance spectra in the vacuum-ultraviolet and near-infrared spectral regions were obtained, ing a transparency in the range from 134 to 4230?nm. The refractive indices were accurately measured at 12 wavelengths from 0.2537 to 1.530?μm and the Sellmeier equations constructed. Moreover, the nonlinear optical coefficients of the BPO4 crystal were measured with the Maker fringes technique, which gave a result of
